Abstract
Controlling defect structure in multiwalled carbon nanotube (MWCNT) is essential to realization of MWCNT devices. Here, we show that the diagram of the Raman intensity ratio of the G to D peaks and the G peak width can reveal two damaging stages of MWCNT films. In a transition period, additional peaks appeared in the X-ray absorption spectra, thereby indicating some significant change in the electronic structure. Also, a remarkable increase occurred in the diameter of the MWCNTs in the latter stage, suggesting the formation of dislocation dipoles which may relate to the change in the properties of field-emission devices.
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