Abstract

Electron backscatter diffraction (EBSD) is one of the primary tools in materials development and analysis. The technique can perform simultaneous analyses at multiple length scales, providing local sub-micron information mapped globally to centimeter scale. Recently, a series of technological revolutions simultaneously increased diffraction pattern quality and collection rate. After collection, current EBSD pattern indexing techniques (whether Hough-based or dictionary pattern matching based) are capable of reliably differentiating between a "user selected" set of phases, if those phases contain sufficiently different crystal structures. EBSD is currently less well suited for the problem of phase identification where the phases in the sample are unknown. A pattern analysis technique capable of phase identification, utilizing the information-rich diffraction patterns potentially coupled with other data, such as EDS-derived chemistry, would enable EBSD to become a high-throughput technique replacing many slower (X-ray diffraction) or more expensive (neutron diffraction) methods. We utilize a machine learning technique to develop a general methodology for the space group classification of diffraction patterns; this is demonstrated within the $\lpar 4/m\comma \;\bar{3}\comma \;\;2/m\rpar$ point group. We evaluate the machine learning algorithm's performance in real-world situations using materials outside the training set, simultaneously elucidating the role of atomic scattering factors, orientation, and pattern quality on classification accuracy.

Highlights

  • Conventional electron backscatter diffraction (EBSD) is a standard scanning electron microscope (SEM)-based technique used to determine the three-dimensional orientation of individual grains in crystalline materials

  • Inspired by the similarities between convergent beam electron diffraction (CBED) and EBSD patterns (Vecchio & Williams, 1987; Cowley, 1990; Michael & Eades, 2000), we propose applying an image recognition technique from the machine learning field to provide an opportunity for real-time space group recognition in EBSD

  • The model is first trained on one material from each of six space groups in the (4/m, 3, 2/m) point group; there are 10 space groups within the (4/m, 3, 2/m) point group, but suitable samples for 4 of these space groups could not be obtained

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Summary

Introduction

Conventional electron backscatter diffraction (EBSD) is a standard scanning electron microscope (SEM)-based technique used to determine the three-dimensional orientation of individual grains in crystalline materials. Methods utilizing hand-drawn lines overlaid on individual Kikuchi diffraction patterns have been developed for determining the Bravais lattice or point group (Baba-Kishi & Dingley, 1989; Goehner & Michael, 1996; Michael & Eades, 2000; Li & Han, 2015) These represent important milestones for phase identification from EBSD patterns; they remain limited by at least one of the following: analysis time per pattern, the need for an expert crystallographer, or necessitating multiples of the same diffraction pattern with different SEM settings (Li & Han, 2015)

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