Deep neural network based on multi-level wavelet and attention for structured illumination microscopy

Abstract

Structured illumination microscopy (SIM) is a popular and powerful super-resolution (SR) technique in biomedical research. However, the conventional reconstruction algorithm for SIM heavily relies on the accurate prior knowledge of illumination patterns and signal-to-noise ratio (SNR) of raw images. To obtain high-quality SR images, several raw images need to be captured under high fluorescence level, which further restricts SIM’s temporal resolution and its applications. Deep learning (DL) is a data-driven technology that has been used to expand the limits of optical microscopy. In this study, we propose a deep neural network based on multi-level wavelet and attention mechanism (MWAM) for SIM. Our results show that the MWAM network can extract high-frequency information contained in SIM raw images and accurately integrate it into the output image, resulting in superior SR images compared to those generated using wide-field images as input data. We also demonstrate that the number of SIM raw images can be reduced to three, with one image in each illumination orientation, to achieve the optimal tradeoff between temporal and spatial resolution. Furthermore, our MWAM network exhibits superior reconstruction ability on low-SNR images compared to conventional SIM algorithms. We have also analyzed the adaptability of this network on other biological samples and successfully applied the pretrained model to other SIM systems.