Abstract
The superradiant decay rate and renormalized frequency shift of Wannier excitons in a semiconductor film of N layers are studied. It is found that both the decay rate and renormalized frequency shift show oscillatory dependence on layer thickness. The crossover from the superradiant exciton to the bulk polariton when varying N from 1 to $\ensuremath{\infty}$ is also examined.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.