Abstract

The decay channels of the $\mathrm{Ar}{2s}^{\ensuremath{-}1}$ and ${2p}^{\ensuremath{-}1}$ and $\mathrm{Kr}{3p}^{\ensuremath{-}1}$ and ${3d}^{\ensuremath{-}1}$ electronic hole states have been investigated by means of photoelectron-photoion coincidence measurements following innershell ionization using synchrotron radiation. With the method of final ion-charge resolving electron spectroscopy it has become possible to disentangle different contributions to the electron spectrum and to determine the decay probabilities ${P(nl}^{\ensuremath{-}1}\ensuremath{\rightarrow}n+)$ of the above-mentioned hole states ${(nl}^{\ensuremath{-}1})$ to the final ionic charge states $n+.$ A high correlation with threefold or even fourfold charged ions has been found in all cases. Possible decay routes, via cascade or direct double Auger processes, are discussed on the basis of energy-level schemes calculated with the Hartree-Fock method. Special emphasis is laid on the examination of the $\mathrm{Kr}{3p}^{\ensuremath{-}1}$ decay process, where the two fine-structure components $(j=1/2,3/2)$ exhibit noticeably different decay probabilities to ${\mathrm{Kr}}^{3+}$ and ${\mathrm{Kr}}^{4+}$ final ionic charge states.

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