Data acquisition system for OLED defect detection and augmentation of system data through diffusion model

Abstract

This paper presents a system and model for data acquisition and augmentation in OLED panel defect detection to improve detection efficiency. It addresses the challenges of data scarcity, data acquisition difficulties, and classification of different defect types. The proposed system acquires a hypothetical base dataset and employs an image generation model for data augmentation. While image generation models have been instrumental in overcoming data scarcity, time and cost constraints in various fields, they still pose limitations in generating images with regular patterns and detecting defects within such data. Even when datasets are available, the precise definition and classification of different defect types becomes imperative. In this paper, we investigate the feasibility of using an image generation model to generate pattern images for OLED panel defect detection and apply it for data augmentation. In addition, we introduce an OLED panel defect data acquisition system, improve the limitations of data augmentation, and address the challenges of defect detection data augmentation using image generation models.