Abstract
Results of a new stationary microfocusing sealed tube X-ray source are presented. Measurements with the new low-maintenance, high-brilliance microfocus source IµS equipped with different two-dimensional beam shaping multilayer optics are shown. The comparison of IµS with typical sealed tube fine focus systems shows data of outstanding quality in diffractometry applications using a two-dimensional detector. A huge improvement in intensity and resolution by a factor of about 16 was observed. The IµS delivers very promising results especially for measurements of powders in transmission geometry. The focusing on the detector enables better crystallite statistics and better resolution. For some applications there are even intensity gain factors in the range of 100 achievable. For small angle scattering a factor of 5 in comparison to a typical sealed tube instrument was observed when using an IµS with optics for a parallel beam.
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