Abstract
Accurate physics modeling of a photon counting detector is essential for detector design and performance evaluation, Computer Tomography (CT) system-level performance investigation, material decomposition, image reconstruction. The detector response is complicated because various effects involve, including fluorescence X-rays, primary electron path, charge diffusion, charge repulsion, and charge trapping. In this paper, we will present a comprehensive detector modeling approach, which incorporates all these effect into account.
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