Abstract
Abstract Current-voltage characteristics of Ag-sheathed Bi-2223 monocore tapes have been measured at 77 K in low d.c. magnetic fields. Results have been obtained with the c -axis of the sample both parallel and perpendicular to the applied field, together with the force-free orientation. The current–voltage characteristics have been analysed in terms of their n -value ( V ∝ I n ), which characterizes the sharpness of the resistive transition and the second differential (d 2 V /d I 2 ), which shows the distribution in local critical current density values. The second differential has been fitted and analysed using the phenomenological Weibull distribution function, which is based on a weak-link model. The four parameters of this function have been used to investigate the microstructural nature of the sample, in particular, the factors influencing the critical current density and the transport current pathways. The results are consistent with the view that at low fields the critical current density is limited by weak-link grain boundaries and at high fields by intra-granular flux pinning.
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