Crystallography using the diffraction of proton induced X-rays

Abstract

Diffraction (Kossel) patterns are obtained by bombarding single crystals with a 700 keV proton beam and collecting the emitted characteristic X-rays on photographic film. The diffraction curves appear superimposed on the isotropic (in the case of K-lines) distribution typically obtained when non-single-crystal targets are bombarded. They are identified using stereographic projection. In contrast to previous uses of this technique, variable line intensities were observed. They were compared with calculation intensities using a geometrical model based on: proton energy loss, X-ray production cross section, and attenuation before and after being diffracted, as well as competition between reflection and deficiency. A good agreement was obtained. The calculations were carried out up to 5 MeV proton energy and also for a simulated microbeam.