Abstract
Three tools for an automated analysis of electron diffraction pattern and crystallographic visualization are presented. Firstly, diffractGUI determines the zone axis from selected area diffraction, convergent beam diffraction or nanodiffraction patterns and allows for indexing of individual reflections. Secondly, ringGUI identifies crystallographic planes corresponding to the depicted rings in the ring diffraction pattern and can select the sample material from a list of candidates. Both diffractGUI and ringGUI employ methods of computer vision for a fast, robust and accurate analysis. Thirdly, cellViewer is an intuitive visualization tool which is also helpful for crystallographic calculations or educational purposes. diffractGUI and cellViewer can be used together during a transmission electron microscopy session to determine the sample holder tilts required to reach a desired zone axis. All the tools offer a graphical user interface. The toolbox is distributed as a standalone application, so it can be installed on the microscope computer and launched directly from DigitalMicrograph (Gatan Inc.).
Highlights
Most of those who have come across the field of crystallography know how exciting answering the questions raised in this domain can be
Most of them know how tedious it is to answer everyday elementary questions which may often look quite simple: Which material am I looking at and what is the sample orientation? How is the (102) plane situated in this orientation? How should I tilt my TEM holder to get the sample into the [101] zone axis? Many other questions could follow
CrysTBox employs artificial intelligence and computer vision, resulting in tools which allow the vast majority of the input images to be analysed fully automatically in a very short time
Summary
Most of those who have come across the field of crystallography know how exciting answering the questions raised in this domain can be. The CrysTBox tool diffractGUI fits a regular lattice to tens of detected reflections across whole diffraction pattern, which results in a higher accuracy. The input to the tool is the information about the sample unit cell and an experimental ring diffraction image. Several highest peaks (ten by default) corresponding to the brightest rings are localized Their distance from the centre is measured and compared with the theoretical ones specific to the sample material. A theoretical diffraction pattern in the diffraction view and the orientation of the simulated sample in the cell view fully correspond to the experimental image This offers a very fast and intuitive way to see how the atoms are arranged in the crystal observed. 0.2442 À1.1 0.2439 À1.4 0.2402 À5.1 0.2444 À0.9 0.2445 À0.8 0.2443 À1.0 0.1862 À3.9 0.1866 À3.5 0.1873 À2.8
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
