More features, more tools, moreCrysTBox

Abstract

A new release of theCrysTBoxsoftware is introduced. The original toolbox allows for an automated analysis of transmission electron microscope (TEM) images and for crystallographic visualization. The existing tools, which are capable of highly precise analyses of high-resolution TEM images, as well as spot, disc and ring diffraction patterns, are extended to include a tool for automatically measuring TEM sample thickness using convergent beam electron diffraction in a two-beam approximation. An implementation of geometric phase analysis is newly available, employing one of the existing tools to identify parameters and indices of crystallographic planes depicted in the input image and allowing easier and more accurate analysis. The crystallographic visualization capabilities are extended as well. Along with the simulated diffraction pattern and atomic structure, a stereographic projection and inverse pole figure tool is newly offered. A new tool able to visualize the atomic structure of two different phases and their interface is also introduced.