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Abstract
The Bi2O3 and reduced graphene (RG)-Bi2O3 nano-composite thin films are synthesized using modified sol-gel process. For structural examination, the samples are analyzed using XRD. Using the Scherrer equation and a modified Scherrer plot, the sample's structural parameters are calculated. The materials' size and strain were estimated from different methods like modified Williamson-Hall (W–H), Halder-Wagner (H–W), and Size Strain Plot (SSP) with logical validity. The different crystallographic parameters obtained are compared and presented in this work.
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