Abstract
To attain a deep understanding of piezoelectric and dielectric properties dependence of crystallographic orientation, the rhombohedral 0.90(Bi0.5Na0.5)TiO3-0.10(Bi0.5K0.5)TiO3 (abbreviated as BNT-BKT) single-crystal films with three primary orientations of (100), (110), (111) were obtained by sol-gel method. Crystallographic structure measurement by X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) revealed that the BNT-BKT films display a pure perovskite phase and a good epitaxial relationship. Crystallographic orientation dependence of piezoelectric and dielectric properties of the BNT-BKT thin films was investigated. The superior piezoelectric properties in (100)-oriented epitaxial thin films are mainly derived from the intrinsic piezoelectric activities based on the crystallographic orientation and corresponding ferroelectric domain structure analysis. It is also important to note that the Curie temperature (Tc) and dielectric permittivity in piezoelectric films were also affected by the crystallographic orientation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
