Crystallization of Bismuth Borosilicate‐Based Dielectric Thick Films on a LiZn Ferrite Substrate

Abstract

The compatibility and crystallization of dielectric thick films, consisting of a bismuth borosilicate glass and crystalline cordierite, on a LiZn ferrite substrate were investigated by focusing on phase development and microstructural changes. Significant diffusion of Li and Fe from the substrate to the dielectric was confirmed as unexpected crystalline phases such as Li2Al2Si3O10 and Fe2O3 were found in the thick films fired at 850°C. The crystallization was believed to be initiated from the film interface and developed further toward the film surface as evidenced from cross‐sectional microstructures of the films with additional firings. The degree of crystallization and the relative contents of the observed phases were dependent on the ratio between the glass and cordierite and the number of refirings.