Crystallization Behavior and Dielectric Properties of a New High Dielectric Constant Low‐Temperature Cofired Ceramics Material Based on Nd2O3–TiO2–SiO2 Glass–Ceramics

Abstract

The crystallization and sintering behaviors of glass–ceramics (Nd2O3–TiO2–SiO2) have been investigated using the differential thermal analyzer, thermal mechanical analyzer, X‐ray diffractometer, scanning electron microscopy, and transmission electron microscopy. The results showed that the onset of glass shrinkage occurred at around the glass transition temperature (Tg=708°C). The first crystalline phase, Nd2Ti4O11, was observed at around 775°C. Fully densified NdTiSi glass can be obtained via glass viscous flow before the second crystalline phase, Nd0.66TiO3, occurring at about 850°C. The as‐prepared NdTiSi glass–ceramics sintered at 900°C exhibited a high dielectric constant of 23 and a quality factor of about 600, which provided a promising candidate for low‐temperature cofired ceramics applications.