Abstract
Zinc selenide (ZnSe)/copper-phthalocyanine (CuPc) hybrid thin films were prepared by electron beam evaporator on glass substrate from %weight mixed of ZnSe:CuPc powders. The film thickness was 500 nm. The substrate temperatures were varied at room temperature to 150degC. X-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM) were used to characterize the crystalline structure and morphology of deposited hybrid thin films. XRD patterns show two peaks of the orientation of (200) plane monoclinic structure in CuPc material and (111) plane cubic structure in ZnSe material. The FE-SEM image of hybrid thin film deposited with substrate temperature at 150degC seems to have the nanocrystalline-ZnSe formed on nanorod-like CuPc.
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