Abstract
This study presents a comprehensive investigation into the dielectric properties of LiY9Si6O26 ceramics, which were prepared for the first time using the solid-state method. XRD patterns and Rietveld refinement analysis conclusively demonstrate that LiY9Si6O26 adopts a hexagonal crystal structure with space group P63/m (176). Furthermore, Raman spectroscopy reveals a significant correlation between the quality factor and the FWHM of the A1g(O) mode at 879 cmâ1. Transmission electron microscopy (TEM) was employed to verify the ordered layered structure inherent in the hexagonal LiY9Si6O26 ceramics. The microstructure of the ceramic grains was analysed using scanning electron microscopy (SEM), which revealed a remarkably high relative density of 96.4% for the LiY9Si6O26 ceramic. The SiâO bond valences (VSiâO) were found to be closely associated with the Ïf in LiY9Si6O26 ceramics. Remarkably, the microwave dielectric properties of LiY9Si6O26 ceramics sintered at 1425 °C were ascertained to be Δr = 10.54, Q Ă f = 25,579 GHz (f = 10.3 GHz), and Ïf = 2.64 ppm/°C. These outstanding properties position LiY9Si6O26 ceramics as promising candidates for high-performance dielectric materials.
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