Abstract
An x-ray diffraction structural analysis was carried out on trimethyl(1-silatranylmethyl)ammonium iodide on a diffractometer using 1792 reflections to R = 0.069. The length of the transannular Si-N bond (2.08(1) A) corresponds to that calculated using the Taft substituent constant for CH2N (CH3)3. The nonbonded interactions lead to marked departure of the N-Si-C(H2) fragment from linearity (the angle at the Si atom is 175.7(6)) and expansion of the SiC(H2)N bond angle to 121.2(9). The nature of the ionic interaction in the crystal is discussed.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
