Abstract
The development of focusing crystal spectrometers for Compton scattering studies from 1930s to present is reviewed. The design principles have stayed the same, but the efficiency has improved much owing to the availability of large perfect crystal analyzers and efficient detectors. The reflectivity and energy resolution of the crystal can be tailored to the needs of the experiment by the asymmetric cut, thickness and bending radius of the crystal, and the response function of the spectrometer can be calculated precisely. The spectrometers at synchrotron radiation beamlines achieve better than 0.1 a.u. momentum resolution, and several statistically accurate Compton spectra can be acquired in one day. The latest developments include spectrometers that operate in the 100 keV range, and count rates are enhanced by using wide energy bands and dispersion compensation. Results obtained by a scanning reflection-type spectrometer installed at a rotating-anode X-ray generator demonstrate that accurate Compton profiles of light-element compounds can be determined even with a laboratory instrument. A map of the reciprocal form factor of silicon is constructed from 10 directional Compton profiles, and the map reveals details of chemical bonding.
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