Crystal Imperfections Seen by X-Ray Diffraction Topography

Abstract

The chapter provides updated information on characterization-type results obtained via several x-ray diffraction topography (XRDT) techniques, following a number of post-founding reports. Internal lattice strains imaged via XRDT methods are presented for relatively low dislocation density, or dislocation-free, crystals, much as investigated for higher dislocation density materials by Professor Gareth Thomas, colleagues, and students via transmission electron microscopy (TEM) methods. Relating to the broad range of materials covered today by The Minerals, Metals and Materials Society (TMS), various characterization-type results are shown to be obtainable for millimeter-to-centimeter size crystals exhibiting either metallic, ionic, covalent, or molecular (energetic) type bonding between their respective constituent atoms or molecules. With relation to pioneering XRDT, field ion microscopy (FIM), and, especially, TEM defect observations, such as reported in the latter case and colleagues and students, a number of experimental/model XRDT results are reported in the chapter for a variety of relatively perfect crystals of quite different materials.