Abstract
Improvements in measurements of intensities and energies of γ-rays and X-rays by crystal diffraction spectrometers since 1962 are discussed. The curved crystal line source transmission spectrometer is the most popular crystal spectrometer for (nγ) and (βγ) measurement probably because it gives the greatest counting rate per unit mass of source material. The curved crystal line focus spectrometer with its extended source and relatively small detector seems best suited for measurements of muonic and pionic X-rays and the double flat crystal spectrometer has given the most precise measurements of absolute γ-ray energies. For all types of spectrometers the precision of diffraction angle measurement has increased from 0.1 to ≤ 0.01 s of arc resulting in energy measurements, between 40 and 400 keV, of a precision of ≤1:10 6. The recent use of Si and Ge crystals, ten times more perfect than crystals available previously, has made possible still further improvement in resolution and precision.
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