Abstract
The noise behavior of monolithic preamplifiers using JFETs as input elements has been investigated on a broad temperature range, from room temperature down to 77 K. The preamplifiers under study are charge integrators intended for use with radiation detectors. The parameter of dominant interest in the analysis is the equivalent noise charge (ENC). The investigation addresses two issues. One is the ENC dependence on temperature. The other one is the extent to which ENC is affected when the preamplifiers are irradiated in cryogenic conditions.
Full Text
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call