Abstract
The use of liquid metal ion sources to form finely focused probes has enabled analytical imaging by secondary ion mass spectrometry to achieve, in favorable cases, spatial resolution approaching the theoretical localization limits of the method. As a drawback, however, the large intrinsic energy spread of such sources significantly constrains both the minimum size of the probe and the analytical sensitivity-analytical image resolution that are possible. In the context of these limitations, recent applications of a high resolution scanning ion microprobe to studies of Al-Li alloys, high T c superconductors and photoemulsion engineered microcrystals are discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
