Abstract
X-ray diffraction rocking curves are used to measure the c axis alignment of TlBa 2Ca 2Cu 3O x films grown on polycrystalline substrates with thickness varying from 3 to 10.5 μm. Films thicker than 3 μm are found to contain two layers: a well aligned (3.5° FWHM) bottom layer, and a poorly aligned (greater than 12° FWHM) top layer. Azimuthal scans show that the component with good long-range out-of-plane alignment retains its characteristic colony microstructure of local in-plane alignment as film thickness increases. The length dependence of the critical current density may be accounted for by assuming that all the supercurrent is carried by the well-aligned component.
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