Development of the critical film thickness correlation for an advanced annular film mechanistic dryout model applicable to MARS code

Abstract

It is generally assumed in the mechanistic film dryout model that the critical heat flux (CHF) arises when liquid film calculated from evaporation, droplet entrainment and deposition gets dryout. The dryout of film is usually assumed when film thickness becomes zero. However, it was indicated that the complete dryout assumption can estimate CHF well for uniform heating case but cannot simulate accurately for non-uniform heating case. The critical film thickness concept may be an appropriate approach physically because there is a possibility of instantaneous disappearance of liquid film when it gets very thin. Therefore, a critical dryout film thickness correlation was developed to properly model dryout phenomenon together with MARS code based on experimental data. The modified version of MARS implementing a newly developed critical dryout film thickness correlation was assessed using various dryout data including those of non-uniform heating case and flow reduction transient test. The prediction results showed improved agreement with the experimental data.