Abstract
The crack tip shielding or antishielding produced by distributions of voids, gas filled bubbles and microcracks is found. Depending upon how these defects are distributed about a crack, these defects can either shield a crack or antishield it. The magnitude of the change of the crack tip stress intensity factor arising from the presence of a dilute distributions of defects is of the typical order of magnitude of ( b λ K+[p g-( λ b)]λ 1 2 . Here K is the applied stress intensity factor, b is the radius of a defect, λ is their separation distance, P g is the gas pressure within the bubble, and γ is the surface energy of the solid. High bubble concentrations or very high over-pressures ( [P g − ( γ b )] > 2 to 50 GPa) are required for very large changes in the crack tip stress intensity factor.
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