Cover Picture: The Role of Dissociative Electron Attachment in Focused Electron Beam Induced Processing: A Case Study on Cobalt Tricarbonyl Nitrosyl (Angew. Chem. Int. Ed. 40/2011)

Sarah Engmann,Oddur Ingólfsson,Štefan Matejčík,Michal Stano

doi:10.1002/anie.201104739

Cover Picture: The Role of Dissociative Electron Attachment in Focused Electron Beam Induced Processing: A Case Study on Cobalt Tricarbonyl Nitrosyl (Angew. Chem. Int. Ed. 40/2011)

Sarah Engmann, Oddur Ingólfsson + Show 2 more

https://doi.org/10.1002/anie.201104739

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Journal: Angewandte Chemie (International ed. in English)	Publication Date: Aug 24, 2011
Citations: 1

Affiliation: University of Iceland, Comenius University Bratislava

#Focused Electron Beam Induced Processing #Cross-sections For Dissociative Electron Attachment + Show 8 more

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Abstract

Absolute cross-sections for dissociative electron attachment (DEA) to the typical focused electron beam induced processing (FEBIP) precursor cobalt tricarbonyl nitrosyl are reported. Nanostructures written by FEBIP can potentially be smeared and contaminated by back-scattered and secondary low-energy electrons. In their Communication on page 9475 ff. Š. Matejčík, O. Ingólfsson, and co-workers discuss the role of DEA to metal–organic compounds in FEBIP.

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