Coupled SET pulses modeling based on LUT in ultra deep submicron technology

Abstract

Soft error induced by SET (single event transient) has been more and more substantial. It has been proved that previously decoupled SET pulse models will induce great error, such as double exponential model and piecewise linear model. In this paper, we present a novel LUT (look up table) based SET pulse model which can reflect the coupled effect of charge collection and circuit response. We realize this model in SPICE circuit simulator. Experiments show that the SET pulses obtained by our methods agree with device/circuit mix-mode simulation, and our method is much faster.