Abstract

Abstract. The induced (drag) resistivity (ρ_D) is calculated numerically in low temperature, large interlayer separation and weak interactive regime for 2D hole-hole (h-h) static interactions using the RPA method, with the geometry of non-homogeneous dielectric medium. Exchange-correlations (XC) and mutual interaction effects are considered in low/high density regime for analysing the drag resistivity. It is found that the drag resistivity is found inhanced on using the XC effects and increases on increasing the effective mass. In Fermi-Liquid regime, drag resistivity is directly proportional to r2/n3 at low temperature. Temperature (T), density (n), interlayer separation (d) and dielectric constant (ϵ2) dependency of drag resistivity is measured and compared to 2D e-e and e-h coupled-layer systems with and without the effect of non-homogeneous dielectric medium.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.