Abstract

The purpose of this work is to investigate the correlations between structures and magnetic properties, transport behaviors of non-epitaxial Fe3Si films fabricated on MgO(001) substrates. Firstly, the single phase polycrystalline Fe3Si films are obtained. These Fe3Si films appear rough texture, which is related to inter-diffusion between Fe and Si layers under high temperature annealing. Moreover, the disparities of Ms and Hc values for these Fe3Si films are linked to structural and chemical order. A particular case in Fe3Si film formed at Fe/Si thickness ratio of 3:1 for 800 °C is observed. The Fe3Si film which fulfills fundamental reflections has high Ms and low Hc value. The electron-electron and anomalous one magnon scattering contributions to the resistivity are operative in low temperature range and the electron-phonon interaction governs it at high temperature region. Finally, the intrinsic anomalous Hall effect contribution is dominating over extrinsic contributions by suitable scaling behavior. The intrinsic factor dominance rises with the improvement of atomic ordering. This law is not followed for the Fe3Si film which fulfills fundamental reflections. The highest intrinsic band structure effect b value in this Fe3Si film is attributed to the influence of the film thickness and Fe and Si atomic composition ratio.

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