Abstract
A computational method for determining the real sizes of quantum dots based on the data of atomic force microscopy (AFM) is suggested. It is shown that the experimentally observed measurement error (for the AFM method) of the sizes of the pyramidal quantum dots with a base edge of a ∼ 30–46 nm, stemming from convolution, is approximately equal to a quarter of the curvature radius of the AFM probe. Calibration curves of the dependence of the photoluminescence-peak positions of InAs-QD/GaAs heterostructures (in the range 900–1800 nm) on the sizes of the quantum dots measured with the probes whose curvature radii were from from 10 to 100 nm are established.
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