Correlation between photorefractive index changes and optical damage thresholds in z-cut proton-exchanged-LiNbO_3 waveguides

Abstract

An interferometric Mach-Zehnder technique very recently developed has been applied to measure photorefractive index changes in different types of z-cut proton-exchanged planar waveguides in LiNbO(3). These measurements are complemented by determining the intensitythreshold for the onset of optical damage with a standard single-beam setup. In the intensity region just below the threshold-intensity obtained in the single-beam experiment the refractive index change is found to saturate at values around1x10(-4). Furthermore, we measure the dark conductivities of proton-exchanged waveguides by monitoring the decay of the light-induced index changes. Via the time constant of the decay we obtain dark conductivities of the order of about 5x10(-16) Omega (-1) cm (-1), that are negligible compared with the photoconductivity within the light intensity range used. The results of the measurements compare well with the predictions of a recent work, that uses a two-center model to explain the optical damage.