Abstract
Epitaxial c-axis YBa 2Cu 3O 7 thin films presenting a rate of c ⊥ 45 in-plane orientation (η) ranging from 0.2 to 49.7% have been grown in situ by laser ablation on (100) MgO in order to study the influence of the high-angle grain boundaries on the microwaves and low-frequencies properties. In spite of the mixed in-plane orientation, the good epitaxial quality is maintained. We found that the microwave surface resistance R s (10 GHz and 77 K), ranging from 0.7 to 46 mΩ, and the surface of the χ″ peak obtained in AC susceptiblity (119 Hz) strongly correlate with η. In contrast a poor or even no correlation was observed with other characteristics such as for example Δθ, T c, or ΔT c. A minimum of R s has been measured for η between 3 and 6% suggesting the necessity of a low quantity of defects such as high-angle grain boundaries in view of microwave applications.
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