Correlated dewetting patterns in thin polystyrene films

Abstract

Listen

Translate article

We describe preliminary results of experiments and simulationsconcerned with the dewetting of thin polystyrene films (thickness< 7nm) on top of silicon oxide wafers. In the experiments we scratched an initiallyflat film with an atomic force microscopy (AFM) tip, producing dry channels inthe film. Dewetting of the films was imaged in situ using AFM and acorrelated pattern of holes (‘satellite holes’) was observed along the rimsbordering the channels. The development of this complex film ruptureprocess was simulated and the results of experiments and simulations are ingood agreement. On the basis of these results, we attempt to explain theappearance of satellite holes and their positions relative to pre-existing holes.