Abstract
Inner shell photoionisation as a basis for surface structure determination is reviewed. During the recent decade, this field has received tremendous impetus from the advent of synchrotron radiation. Core level photoelectron spectroscopy allows the detection at submonolayer levels of foreign adsorbate atoms and the resolution of the first layers from the bulk for a clean single crystal surface as well. The surface-bulk core level binding energy shift is shown to be surface geometry dependent and may be employed to monitor clean surface reconstruction. Shifting following chemisorption, surface core levels deliver information on adsorption binding site geometry. The emission intensity is modulated by photoelectron diffraction effects along k-vector variation obtained by varying photon energy or in measurements resolved in azimuthal and polar angles. Interference patterns are sensitive to bond lengths. Finally correlation with surface extended X-ray fine structure achieved by detecting photon stimulated Auger excitation or ion emission is discussed.
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