Copula based constant-stress PALT using tampered failure rate model with dependent competing risks

Abstract

PurposeAccelerated life tests (ALTs) are used to make timely assessments of the lifetime distribution of highly reliable materials and components. Life test under accelerated environmental conditions may be fully accelerated or partially accelerated. In fully accelerated life testing, all the test units are run at accelerated condition, while in partially accelerated life testing, they are both run at normal and accelerated conditions. The products can fail due to one of the several possible causes of failure which need not be independent. The purpose of this paper is to design constant-stress PALT with dependent competing causes of failure using the tampered failure rate model.Design/methodology/approachGumbel–Hougaard copula is used to model and measure the dependence between the life times of competing causes of failure. The use of the copula simplifies the model specification and gives a general class of distributions with the same dependent structure and arbitrary marginal distributions.FindingsThe optimal plan consists in finding optimum allocation of test units in different chambers by minimizing the reciprocal of the determinant of Fisher Information Matrix. The confidence interval for the estimated values of the design parameters has been obtained and sensitivity analysis carried out. The results of sensitivity analysis show that the plan is robust to small deviations from the true values of baseline parameters.Originality/valueThe model formulated can help reliability engineers obtain reliability estimates quickly of high reliability products that are likely to last for several years.