Abstract
Copper phthalocyanine (CuPc) thin-film transistors (TFTs) have been fabricated using 400 nm polyimide (PI) cured at 250degC as gate dielectric. The root-mean square surface roughness of PI films is 30 Aring. An individual bottom gate, staggered structure was selected to study the device performance. The devices showed p-type electrical characteristics with field-effect mobility, threshold voltage and current on/off ratio values around 1.44 times 10 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-3</sup> cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> V <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> s <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> , 1.1 V and 12, respectively.
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