Abstract
The electrode-active layer interface of organic photovoltaic cells, a critical point in the development of organic devices, was studied by the energy dispersive x-ray reflectivity (EDXR) technique applied in situ. An EDXR-based protocol allowing discrimination between the possible mechanisms that produce the aging process at the interface was established. The study detects photoinduced oxidation of the electrode at the buried interface, to which fading of the device performances could be attributed. This conclusion was further confirmed by results obtained on a new cell, of selectively modified architecture, whose performances turned out to be stable in time.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have