Abstract
The electrode-active layer interface of organic photovoltaic cells, a critical point in the development of organic devices, was studied by the energy dispersive x-ray reflectivity (EDXR) technique applied in situ. An EDXR-based protocol allowing discrimination between the possible mechanisms that produce the aging process at the interface was established. The study detects photoinduced oxidation of the electrode at the buried interface, to which fading of the device performances could be attributed. This conclusion was further confirmed by results obtained on a new cell, of selectively modified architecture, whose performances turned out to be stable in time.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
