Abstract
We present here characteristics of energy dispersive X-ray reflectivity (EDR) technique that is suitable for studying phase transitions in thin films at both laboratory and synchrotron sources. In spite of the poorer resolution of this technique as compare to more widely used angle dispersive reflectivity technique, rapid data collection capability of the EDR technique will find applications in the studies of nano-structured thin films. We demonstrate merit of this technique here using results of thermal properties of thin organic films.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
