Abstract

Magnetic skyrmions are particle-like deformations in a magnetic texture. They have great potential as information carriers in spintronic devices because of their interesting topological properties and favorable motion under spin currents. A new method of nucleating skyrmions at nanoscale defect sites, created in a controlled manner with focused ion beam irradiation, in polycrystalline magnetic multilayer samples with an interfacial Dzyaloshinskii-Moriya interaction, is reported. This new method has three notable advantages: 1) localization of nucleation; 2) stability over a larger range of external field strengths, including stability at zero field; and 3) existence of skyrmions in material systems where, prior to defect fabrication, skyrmions were not previously obtained by field cycling. Additionally, it is observed that the size of defect nucleated skyrmions is uninfluenced by the defect itself-provided that the artificial defects are controlled to be smaller than the inherent skyrmion size. All of these characteristics are expected to be useful toward the goal of realizing a skyrmion-based spintronic device. This phenomenon is studied with a range of transmission electron microscopy techniques to probe quantitatively the magnetic behavior at the defects with applied field and correlate this with the structural impact of the defects.

Highlights

  • A magnetic skyrmion is a quasiparticle of magnetisation characterised by its non-trivial topology

  • To explore artificial defects as a mechanism for skyrmion nucleation, point-like defects were created on two distinct multilayered Pt/Co based systems

  • For transmission electron microscopy (TEM) studies the samples were deposited on substrates with an electron transparent Si3N4 window suspended from a thicker Si frame

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Summary

Introduction

A magnetic skyrmion is a quasiparticle of magnetisation characterised by its non-trivial topology. This paper reports a new method of nucleating skyrmions at nanoscale defect sites, created in a controlled manner with focused ion beam irradiation, in polycrystalline magnetic multilayer samples with an interfacial

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