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https://doi.org/10.1049/el:20040179
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Cite Journal: Electronics Letters |  Publication Date: Mar 4, 2004 |
 Citations: 8 |
Affiliation: Technical University of Denmark
A novel approach to reducing the multiple reflections between the test antenna and the probe in near-field antenna measurements is proposed. Instead of absorbers, this approach makes use of a skirt on the probe to shield against the mounting structure behind the probe.
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