Abstract
Abstract The factors, which influence the internal stresses in glass coated amorphous microwires were discussed in this work in relation to the magnetization behaviour and domain wall propagation. The approach taking into account the technological parameters of manufacturing by Ulitovsky-Taylor method is presented. The magnetization process and domain wall dynamics in Fe77.5Si7.5B15 microwires produced under different conditions but with identical geometric parameters were investigated experimentally and analysed on the basis of internal stress formation in different microwire states: as prepared, after glass removal and after annealing. It is demonstrated that the residual stresses in wires of the same composition are not defined exclusively by their dimensions but depend on the technological regime. The stress modification due to relaxing treatments also proceeds differently in wires produced under different conditions. These conclusions are evidenced by comparing the domain wall mobilities which strongly depend on the internal stress.
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