Abstract
Abstract Up to now, many works have been dedicated to the study of the excitonic parameters of GaN by analyzing cw-spectroscopy results. In this work, time-resolved reflectivity experiments are carried out to record the impulse response of excitons at the femtosecond scale. By combining the analysis of continuous wave and time-resolved reflectivity spectra recorded on high quality GaN samples, the excitonic parameters are determined with accuracy. The oscillator strength evolutions of A, B and C free excitons are analysed versus the in-plane biaxial stress and compared with theoretical predictions.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
