Abstract
A method has been recently developed for measuring thickness variations of a non-conductive cable sheathing, extruded over a grounded metal jacket. The method translates direct capacitance increments, sensed by probes sliding on the surface of the sheath, into thickness increments. The accuracy of the system based on this method is sufficiently high that the electrical error, which is of the order of a few thousandths of a μμF, can be disregarded. Experimental data indicate that accuracy of the new system for absolute thickness measurements of homogeneous samples in stationary conditions is of the order of 0.002‖. The error caused by translating capacitance to thickness depends on manufacturing elements and process tolerances, and can be evaluated on a statistical basis. Thus incremental measurements of the cable sheath thickness on the production line yield accuracies of the order of 0.003‖. Application of this method to absolute sheath thickness measurements involves assumptions directly related to calibration and manufacturing process control. These aspects are rather extraneous to a measuring system per se, and, therefore, are not within the scope of this paper.
Published Version
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