Abstract
We apply the contactless quasi-steady-state photoconductance (QSSPC) method to co-evaporated methyl ammonium lead iodide (MAPbI3) perovskite thin-films. Using an adapted calibration for ultralow photoconductances, we extract the injection-dependent carrier lifetime of the MAPbI3 layer. The lifetime is found to be limited by radiative recombination at the high injection densities applied during the QSSPC measurement, enabling the extraction of the electron and hole mobility sum in the MAPbI3 using the known coefficient of radiative recombination of MAPbI3. Combining the QSSPC measurement with transient photoluminescence measurements, performed at much lower injection densities, we obtain the injection-dependent lifetime curve over several orders of magnitude. From the resulting lifetime curve, we determine the achievable open-circuit voltage of the examined MAPbI3 layer.
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