Abstract
AbstractAs the conversion efficiency of solar cell approaching its theoretical limits, reducing the power loss during the collection and transmission process is a promising way to improve the performance of solar cell. Cleaved edges create recombination centers, causing up to 0.8%abs (absolute efficiency) of power loss or even more for 156 × 156 mm silicon solar cell. Due to the complexity of edge passivation technique, alternative methods are desired. This article proposes a method to minimize this problem. It is found that most of the recombination current of edge comes from the recombination near the contact and the space charge region (SCR). As a result, keeping the cleaved edge a certain distance away from the contacts and SCR can improve performance effectively. On the other hand, contactless edge can reduce the recombination from the SCR without extra manufacturing difficulty. The results indicate the edge recombination loss can be reduced to less than 0.4%abs after the distance is optimized appropriately.
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