Abstract
The room temperature growth of palladium on 〈111〉 fibre-textured aluminum thin films has been studied by the contact potential difference (CPD) method. As the Pd film thickens, there is an initial decrease in the CPD which reaches a minimum at approximately 0.25 monolayers of Pd added. From this point, the CPD increases almost linearly to the 4 to 5 monolayer range where an inflection in the curve occurs. Added Pd increases the CPD further until a leveling off begins around 7 to 8 monolayers. The saturation value is 1.38 eV. This value matches the bulk work function difference between the (111) Pd and Al surfaces. Reflection high energy electron diffraction (RHEED) patterns confirmed the 〈111〉 fibre texture of the bilayers and indicated that the bulk palladium lattice parameter had been attained. These results support recent ion scattering and photoemission spectroscopic results for thin palladium films on aluminum.
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