Abstract

Device length independent oscillations between 1 and 5 GHz in bulk InP microwave oscillators are plausibly explained as a transferred electron oscillation which is contained in a ‘conductivity notch’. The avalanche breakdown capabilities of GaAs and InP are compared with the aid of a simple inhomogeneity model.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.