Abstract
For design and characterization of packaged RF-band transistor amplifiers, test fixtures consisting of coaxial connectors and planar-type transmission lines are frequently used. We present a method of extracting 3D field simulation parameters of these test fixtures and demonstrate that a circuit model of the test fixtures can be constructed by pure 3D field simulation using the extracted material constants. The developed circuit model predicts measurement results within 0.5 dB. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 48: 498–500, 2006; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21390
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